Electronic Design

Critical ATE requirements for parametric test of optically networked weapon systems

The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...
Semiconductor Engineering

Driving Toward Predictive Analytics With Dynamic Parametric Test

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Electronic Design

Keysight parametric tester reduces time-to-market, cost-of-test

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...