Backscatter imaging is primarily a compositional imaging mode, although it can be used on samples which exhibit excessive charging or on samples which provide poor SE images. The BSE detector can ...

The signals produced during the electron beam-specimen interactions (SE, BSE, and X-rays) are sensed by detectors. The detectors are specifically designed to specialize in and detect one or more types ...

The new TM4000 II benchtop SEM from Hitachi makes advanced electron microscopy ... flexibility you need to truly understand your sample. Choose between SE (surface contrast) and BSE (compositional ...

TESCAN MAGNA features the Triglav™ SEM column with immersion TriLens ... system allows segmenting of your samples with three SE signals (in-chamber, and two in-beam detectors) and three BSE signals ...

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