A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and ... PointRend and Mask-RCNN for various defect types (line-collapse, single bridge, thin bridge, multi ...
Next-generation imaging technology is rapidly expanding beyond smartphones into intelligent devices, robotics, extended ...
Critical Dimension Scanning Electron Microscopy (CD-SEM) is a specialized technique used for high-resolution imaging and precise measurement of nanoscale structures in semiconductor manufacturing and ...
For decades, scientists have relied on electrodes and dyes to track the electrical activity of living cells. Now, UC San Diego engineers have discovered that quantum materials just a single atom thick ...
PORTLAND, Ore. & PALO ALTO, Calif.---Nov. 3, 2016-- Lattice Semiconductor Corporation (NASDAQ:LSCC) (“Lattice” or the “Company”) and Canyon Bridge Capital ...