Three-dimensional (3D) data analysis, especially 3D reconstruction, is critical within integrated circuits for quality control and inspection. The traditional 3D reconstruction, like multi-energy ...

c) SEM-BSE image showing the internal microstructure of the PBF-LB part, composed of cells and dendrites. The region shown in d) was analyzed by EDX mapping technique: e) Al (red) and f) Si (green).

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The last time we used a scanning electron microscope (a SEM), it looked like something from a bad 1950s science fiction movie. These days SEMs, like the one at the IBM research center, look like ...

The Scanning Electron Microscope (SEM) images of Random Access Memory (RAM) chips contain valuable processrelated information, particularly at the edges, which can provide critical insights for ...

Images of members of the Riksdag. There is a high-resolution image of each member of the Riksdag which may be used. The image is available on the member's page under Members and parties. Give the ...